| Sign In | Join Free | My insurersguide.com | 
 | 
Brand Name : Lonroy
Model Number : X-700
Place of Origin : China
MOQ : 1
Price : Negotaible
Payment Terms : L/C,D/A,D/P,T/T,Western Union
Supply Ability : 200
Delivery Time : 5-8 work days
Packaging Details : Wooden package
Certification : ISO ASTM CE
Weight : 3.1 lbs with battery
Voltage : 6-40kV, 200uA Rh
Name : XRF Analyzer
Dimensions : 9.38in (238mm) x 11.15in (283mm) x 3.34in (84mm)
Memory : 1GB
X-200 XRF Analyzer Handheld Spectrometer
X-200 XRF analyzer is the perfect blend of high performance and attractive price.It's a top-performing SDD with highly optimized X-ray tube and detector geometry, plusimproved heat dissipation, reduced weight, and improved durability. Operates onAndroid 0S using Wi-Fi and software with the ease of a smart phone for revolutionaryspeed:connectivity:and test data management.
| Weight | 3.1 lbs with battery | 
| Dimensions | 9.38in (238mm) x 11.15in (283mm) x 3.34in (84mm) | 
| Power | On-board rechargeable Li-ion battery, rechargeable inside device or with external charger, and AC power. | 
| Display | 5″ color touch screen, smartphone-type display - PowerVR SGX540 3D graphic | 
| Sample Viewing | Internal camera for viewing sample before and during analysis for proper sample alignment. Second macro-camera for scanning QR or barcodes and for photo-documentation and report generation. | 
| Comms/Data Transfer | Wi-Fi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software. | 
| Excitation Source | 6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other apps. | 
| Detector | 20mm² silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K- alpha line. | 
| X-Ray Filtering | 6-position filter wheel for beam optimization. | 
| Processor | ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND | 
| Pulse Processor | 14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor; digital filtering implemented in FPGA for high throughput pulse processing 50nS - 24uS peaking time | 
| Calibration | Fundamental Parameters, Compton Normalization, and/or Compton Normalization for Alloy. Geochem, Environmental and Soil calibrations. | 
| Calibration Check | Internal shutter is also 316 stainless for totally automated calibration and energy scale validation. | 
| Environmental Temp. Range | 10°F to 130°F at 25% duty cycle. | 
| Security | Password protected usage (user level) and internal settings (admin). | 
| Regulatory | CE, RoHS, USFDA registered, Canada RED Act. | 
|   | 
| X-200 Portable XRF Analyzer Gun Handheld Spectrometer 1GB Memory Images | 
 Roughness Contour Compound Testing Machine Contour Measurement Equipment
                                                                                    
                        
                        
                        
                                                            Roughness Contour Compound Testing Machine Contour Measurement Equipment
                                                    
                        
                     LR-A093 Roughness Contour Integrated Analyzer Surface Roughness Tester Contour
                                                                                    
                        
                        
                        
                                                            LR-A093 Roughness Contour Integrated Analyzer Surface Roughness Tester Contour
                                                    
                        
                     Roundness And Waviness Automated Single Machine Laboratory Roundness And
                                                                                    
                        
                        
                        
                                                            Roundness And Waviness Automated Single Machine Laboratory Roundness And
                                                    
                        
                     Surface Roughness Measuring Instrument LR-A089 Mechanical Roughness Analysis
                                                                                    
                        
                        
                        
                                                            Surface Roughness Measuring Instrument LR-A089 Mechanical Roughness Analysis
                                                    
                        
                     CE ISO 9001 X-ray Diffractometer Crystal Metal Materials Analyzer AL-Y3000 XRD
                                                                                    
                        
                        
                        
                                                            CE ISO 9001 X-ray Diffractometer Crystal Metal Materials Analyzer AL-Y3000 XRD
                                                    
                        
                     X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500
                                                                                    
                        
                        
                        
                                                            X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500
                                                    
                        
                     XRD-XRF Integrated Analyzer AL-Y3500xrdf X-ray Diffraction Instrument XRF
                                                                                    
                        
                        
                        
                                                            XRD-XRF Integrated Analyzer AL-Y3500xrdf X-ray Diffraction Instrument XRF
                                                    
                        
                     Desktop Two-dimensional AL-Y500 X-ray Diffraction Equipment XRD Analysis
                                                                                    
                        
                        
                        
                                                            Desktop Two-dimensional AL-Y500 X-ray Diffraction Equipment XRD Analysis
                                                    
                        
                     X-ray Fluorescence Metal Coating Thickness Gauge AL-NP-7010 Metal Elements
                                                                                    
                        
                        
                        
                                                            X-ray Fluorescence Metal Coating Thickness Gauge AL-NP-7010 Metal Elements
                                                    
                        
                     Wavelength-dispersive X-ray Fluorescence Spectrometer AL-BP-9010 XRF Cement
                                                                                    
                        
                        
                        
                                                            Wavelength-dispersive X-ray Fluorescence Spectrometer AL-BP-9010 XRF Cement